Kelvin probe force microscopy (abbreviated as KPFM, KFM or SKFM) is a technique predicated on atomic force microscopy (AFM): used to examine the electronic properties of nanoscale materials and ...
The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...
From materials science to biological research, scientists have embraced Kelvin Probe Force Microscopy (KPFM) for measuring the likes of surface potential and work functions. KPFM reproduces the ...
Piezoresponse force microscopy (PFM) is an effective method for examining ferroelectric materials due to its nanometer-level resolution and high sensitivity, inherited from atomic force microscopy ...
In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...
New hybrid nano-microscope by KRISS allows simultaneous measurement of optical and electrical properties. Expected to accelerate nano-scale research on advanced equipment and materials such as bilayer ...
This news release is available in German. Jülich, 27 November 2014 - The resolution of scanning tunnelling microscopes can be improved dramatically by attaching small molecules or atoms to their tip.
Researchers from the National Institute of Standards and Technology (NIST), Gaithersburg, MD, working with colleagues from the National Aeronautics and Space Administration, the National Institute of ...
(Nanowerk News) The Korea Research Institute of Standards and Science (KRISS) has developed a hybrid nano-microscope capable of simultaneously measuring various nanomaterial properties. This ...
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