Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

Yield ramp has historically been the fab's burden. The yield ramp cycle was cleanly partitioned into three phases: process development, pilot production and volume production (Fig. 1). 1. Industry has ...

The way urban areas are designed could impact cardiometabolic health. However, findings in this research area are often abstract, which restricts their implementation in urban design practice. To ...