The Copenhagen Test starts out looking like a familiar spy story but very quickly becomes something much stranger and more ...
Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.
Validates platform compliance with Arm BSA specification.
A Test, Debug, and Silicon Lifecycle Management Architecture for a UCIe-Based Open Chiplet Ecosystem
Abstract: In the last few years, chiplets have become foundational to continuing the pace of innovation. The chiplet market is projected to significantly ramp up in the next few years, and we need to ...
This example demonstrates how you can add unit testing to a Blazor application that contains DevExpress components. The project contains the latest mock implementation for internal DevExpress ...
Abstract: The irregular through-silicon via (TSV) layout complicates the crosstalk’s effect, making parallel testing more difficult. For efficient testing and diagnosis of irregular TSV layouts in ...
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